{"title":"一种高稳定电荷计的低频噪声测量","authors":"S. Nihtianov, Xiaodong Guo","doi":"10.1109/AFRCON.2009.5308334","DOIUrl":null,"url":null,"abstract":"A successful effort is reported on an accurate measurement of the low-frequency (1/f) noise and the thermal stability of the charge-meter presented in [1]. These two parameters are very important for the charge-meter, as its main application is to interface capacitive sensors with extremely high long-term stability and low thermal drift.","PeriodicalId":122830,"journal":{"name":"AFRICON 2009","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Low-frequency noise measurement of a highly stable charge-meter\",\"authors\":\"S. Nihtianov, Xiaodong Guo\",\"doi\":\"10.1109/AFRCON.2009.5308334\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A successful effort is reported on an accurate measurement of the low-frequency (1/f) noise and the thermal stability of the charge-meter presented in [1]. These two parameters are very important for the charge-meter, as its main application is to interface capacitive sensors with extremely high long-term stability and low thermal drift.\",\"PeriodicalId\":122830,\"journal\":{\"name\":\"AFRICON 2009\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AFRICON 2009\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AFRCON.2009.5308334\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AFRICON 2009","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AFRCON.2009.5308334","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low-frequency noise measurement of a highly stable charge-meter
A successful effort is reported on an accurate measurement of the low-frequency (1/f) noise and the thermal stability of the charge-meter presented in [1]. These two parameters are very important for the charge-meter, as its main application is to interface capacitive sensors with extremely high long-term stability and low thermal drift.