分支嵌入式系统可靠性建模指标

2008 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2008-05-21 DOI:10.1109/MEMSTECH.2008.4558742

A. Sydor

{"title":"分支嵌入式系统可靠性建模指标","authors":"A. Sydor","doi":"10.1109/MEMSTECH.2008.4558742","DOIUrl":null,"url":null,"abstract":"A method of investigation of reliability indices for ramified systems by means of generating functions is developed taking account of aging of the system's output elements. Main reliability indices of ramified embedded systems are examined in this paper.","PeriodicalId":265845,"journal":{"name":"2008 International Conference on Perspective Technologies and Methods in MEMS Design","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Modeling indices of reliability for ramified embedded systems\",\"authors\":\"A. Sydor\",\"doi\":\"10.1109/MEMSTECH.2008.4558742\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method of investigation of reliability indices for ramified systems by means of generating functions is developed taking account of aging of the system's output elements. Main reliability indices of ramified embedded systems are examined in this paper.\",\"PeriodicalId\":265845,\"journal\":{\"name\":\"2008 International Conference on Perspective Technologies and Methods in MEMS Design\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Perspective Technologies and Methods in MEMS Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMSTECH.2008.4558742\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Perspective Technologies and Methods in MEMS Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSTECH.2008.4558742","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

考虑系统输出元件的老化，提出了用生成函数法求解分支系统可靠性指标的方法。本文对分支嵌入式系统的主要可靠性指标进行了研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Modeling indices of reliability for ramified embedded systems

A method of investigation of reliability indices for ramified systems by means of generating functions is developed taking account of aging of the system's output elements. Main reliability indices of ramified embedded systems are examined in this paper.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2008 International Conference on Perspective Technologies and Methods in MEMS Design

自引率

0.00%

发文量