功率mosfet在空间中加强了单事件效应(SEE)

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems Pub Date : 1995-09-18 DOI:10.1109/RADECS.1995.509786

D. Carley, C. Wheatley, J. Titus, D. I. Burton

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引用次数: 11

摘要

介绍了Harris“FS”系列空间硬化功率mosfet的单事件效应和总剂量响应的测量结果。这种硬度似乎为商业空间需求提供了一个突破。

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Power MOSFETs hardened for single event effects (SEE) in space

Measurements are presented for the single event effects and total dose responses of the newly introduced Harris "FS" series of space hardened power MOSFETs. The hardness appears to offer a breakthrough for commercial space requirements.

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Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems

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