D. Nozadze, Amendra Koul, Kartheek Nalla, Mike Sapozhnikov, V. Khilkevich
{"title":"弱耦合和强耦合PCB走线中延时倾斜对差分插入损耗的影响","authors":"D. Nozadze, Amendra Koul, Kartheek Nalla, Mike Sapozhnikov, V. Khilkevich","doi":"10.1109/EPEPS.2017.8329757","DOIUrl":null,"url":null,"abstract":"In this paper, effect of time delay skew (TDS) on differential insertion loss (IL) is studied in both weak and strong forward coupling cases. It is showed that TDS impacts differential IL and impact depends on amount of forward coupling. To predict additional differential IL due to TDS, analytical formula is derived and heuristic formula is constructed based on fitting to simulation results in weak and strong forward coupling cases, respectively. The predictions are validated by simulations and measurements.","PeriodicalId":397179,"journal":{"name":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Effect of time delay skew on differential insertion loss in weak and strong coupled PCB traces\",\"authors\":\"D. Nozadze, Amendra Koul, Kartheek Nalla, Mike Sapozhnikov, V. Khilkevich\",\"doi\":\"10.1109/EPEPS.2017.8329757\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, effect of time delay skew (TDS) on differential insertion loss (IL) is studied in both weak and strong forward coupling cases. It is showed that TDS impacts differential IL and impact depends on amount of forward coupling. To predict additional differential IL due to TDS, analytical formula is derived and heuristic formula is constructed based on fitting to simulation results in weak and strong forward coupling cases, respectively. The predictions are validated by simulations and measurements.\",\"PeriodicalId\":397179,\"journal\":{\"name\":\"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2017.8329757\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2017.8329757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effect of time delay skew on differential insertion loss in weak and strong coupled PCB traces
In this paper, effect of time delay skew (TDS) on differential insertion loss (IL) is studied in both weak and strong forward coupling cases. It is showed that TDS impacts differential IL and impact depends on amount of forward coupling. To predict additional differential IL due to TDS, analytical formula is derived and heuristic formula is constructed based on fitting to simulation results in weak and strong forward coupling cases, respectively. The predictions are validated by simulations and measurements.