fib修饰Si(100)上GaAs MBE生长的研究

M. Eremenko, N. Shandyba, N. Chernenko, S. Balakirev, M. Solodovnik, O. Ageev
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引用次数: 0

摘要

本文研究了Si衬底局部区域聚焦离子束修饰方式对分子束外延生长GaAs层的影响。研究发现,在砷流中退火后,Ga液滴的结晶不会导致表面形貌的显著变化。研究还发现,在30 kV的加速电压下,GaAs在修饰区域的衬底上生长,并在800℃的温度下进行后续退火,可以形成纳米线。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of GaAs MBE growth on FIB-modified Si(100)
In this work, we investigated the influence of the focused ion beams modification modes of the Si substrate local areas on the subsequent growth of GaAs layers by the molecular beam epitaxy. It was found that the crystallization of Ga droplets upon annealing in an arsenic flow does not lead to a significant change in the surface morphology. It was also found the growth of GaAs on substrates with areas modified at an accelerating voltage of 30 kV and subjected to subsequent annealing at a temperature of 800°C results in the formation of nanowires.
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