S. Suryagandh, Mayank Gupta, Zhiyuan Wu, S. Krishnan, M. Pelella, J. Goo, C. Thuruthiyil, J. An, Brian Q. Chen, N. Subba, L. Zamudio, J. Yonemura, A. Icel
{"title":"应力对65nm PDSOI技术中各种电路特性的影响","authors":"S. Suryagandh, Mayank Gupta, Zhiyuan Wu, S. Krishnan, M. Pelella, J. Goo, C. Thuruthiyil, J. An, Brian Q. Chen, N. Subba, L. Zamudio, J. Yonemura, A. Icel","doi":"10.1109/ESSDERC.2007.4430893","DOIUrl":null,"url":null,"abstract":"Logic performance is improved by creating more stress in the channel in advanced CMOS technologies. Impact of stress on different circuit blocks in a microprocessor chip has not been studied in detail. This paper presents a comprehensive study on the effects of stress and the corresponding process steps on various circuit characteristics. Analog behavior, hysteresis and noise properties are investigated to understand the effect of stress on them. These characteristics play important roles in determining the performances of analog/phy, I/O and PLL blocks respectively. It is shown that the type of process steps used for stress optimization can significantly alter the performance of various circuits.","PeriodicalId":121828,"journal":{"name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impact of stress on various circuit characteristics in 65nm PDSOI technology\",\"authors\":\"S. Suryagandh, Mayank Gupta, Zhiyuan Wu, S. Krishnan, M. Pelella, J. Goo, C. Thuruthiyil, J. An, Brian Q. Chen, N. Subba, L. Zamudio, J. Yonemura, A. Icel\",\"doi\":\"10.1109/ESSDERC.2007.4430893\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Logic performance is improved by creating more stress in the channel in advanced CMOS technologies. Impact of stress on different circuit blocks in a microprocessor chip has not been studied in detail. This paper presents a comprehensive study on the effects of stress and the corresponding process steps on various circuit characteristics. Analog behavior, hysteresis and noise properties are investigated to understand the effect of stress on them. These characteristics play important roles in determining the performances of analog/phy, I/O and PLL blocks respectively. It is shown that the type of process steps used for stress optimization can significantly alter the performance of various circuits.\",\"PeriodicalId\":121828,\"journal\":{\"name\":\"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSDERC.2007.4430893\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2007.4430893","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impact of stress on various circuit characteristics in 65nm PDSOI technology
Logic performance is improved by creating more stress in the channel in advanced CMOS technologies. Impact of stress on different circuit blocks in a microprocessor chip has not been studied in detail. This paper presents a comprehensive study on the effects of stress and the corresponding process steps on various circuit characteristics. Analog behavior, hysteresis and noise properties are investigated to understand the effect of stress on them. These characteristics play important roles in determining the performances of analog/phy, I/O and PLL blocks respectively. It is shown that the type of process steps used for stress optimization can significantly alter the performance of various circuits.
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