用于逻辑锁定的故障钥匙门

De-Xuan Ji, Hsiao-Yu Chiang, Chia-Chun Lin, Chia-Cheng Wu, Yung-Chih Chen, Chun-Yao Wang
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引用次数: 1

摘要

逻辑锁定是一种用于知识产权保护的技术。提出了一种基于可满足性(SAT)算法的有效攻击方法,即SAT攻击。为了加强时序电路的逻辑锁定,本文提出了一种基于故障的时序电路逻辑锁定方法。提出的新密钥门方案可以产生小故障,并使用上升和下降转换作为全面逻辑锁定的密钥输入。实验结果表明,所提出的故障密钥门(GK)具有很高的嵌入能力,可以嵌入到IWLS2005基准[22]中。在使用GKs加密的设计中,对于8、16和32个密钥输入的加密,单元面积开销平均分别为10.68%、12.22%和26.11%,当GKs与其他逻辑锁定方法结合使用时,开销可以大大降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Glitch Key-Gate for Logic Locking
Logic locking is a technique used for intellectual property protection. An effective attacking method based on satisfiability (SAT) algorithm, known as SAT attack, was proposed to decrypt an encrypted design successfully. To strengthen logic locking, this paper proposes a glitch-based logic locking method designed for sequential circuits. The proposed new schemes of key-gates can generate glitches, and use rising and falling transitions as key-inputs for the comprehensive logic locking. Experimental results show that the proposed glitch key-gate (GK) has high capability to be embedded in a set of IWLS2005 Benchmarks [22]. The cell area overhead in the designs encrypted with GKs are 10.68%, 12.22%, and 26.11% on average for encryptions with 8, 16, and 32 key-inputs, respectively, and the overhead can be reduced substantially when the GKs are combined with other logic locking methods.
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