{"title":"发展与工业化","authors":"M. Riffiod, P. Caspi, C. Piala, J. Voirin","doi":"10.1145/1266366.1266672","DOIUrl":null,"url":null,"abstract":"This second technical session illustrates the methodological dimensions of technology transfer. It elaborates on some methodologies deployed in critical steps of the whole embedded systems development process, particularly to specify safety critical embedded systems, to manage obsolescence of components and to certify the airworthiness of the final solutions.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development and industrialisation\",\"authors\":\"M. Riffiod, P. Caspi, C. Piala, J. Voirin\",\"doi\":\"10.1145/1266366.1266672\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This second technical session illustrates the methodological dimensions of technology transfer. It elaborates on some methodologies deployed in critical steps of the whole embedded systems development process, particularly to specify safety critical embedded systems, to manage obsolescence of components and to certify the airworthiness of the final solutions.\",\"PeriodicalId\":205976,\"journal\":{\"name\":\"Design, Automation and Test in Europe\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Design, Automation and Test in Europe\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1266366.1266672\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1266366.1266672","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This second technical session illustrates the methodological dimensions of technology transfer. It elaborates on some methodologies deployed in critical steps of the whole embedded systems development process, particularly to specify safety critical embedded systems, to manage obsolescence of components and to certify the airworthiness of the final solutions.