紧密耦合微带传输线的数值模拟

J. Bagby
{"title":"紧密耦合微带传输线的数值模拟","authors":"J. Bagby","doi":"10.1109/SOUTHC.1995.516133","DOIUrl":null,"url":null,"abstract":"As integrated circuit feature sizes decrease and clock speeds increase, the problems of coupling between adjacent microstrip transmission lines and devices become more severe. This is especially true in communication circuits, such as pagers and cellular communications devices. In these cases the simultaneous presence of RF and digital circuitry increases the severity of coupling problems. In the paper an integral equation formulation is used to analyze closely-coupled microstrip transmission lines. A method of moments (MOM) solution is implemented utilizing basis functions which incorporate appropriate edge conditions for current components, allowing for close-form evaluation of spatial integrals. In contrast with earlier subdomain basis MOM solutions, greatly improved accuracy is obtained using far fewer terms. Results in the form of propagation factors and current distributions are presented for several modes, and are compared with the results of other techniques. These results are used as a basis to formulate several \"rule of thumb\" design guides for RF circuits to minimize coupling and cross-talk problems as far as possible. Other strategies for minimizing coupling in RF circuits are also discussed.","PeriodicalId":341055,"journal":{"name":"Proceedings of Southcon '95","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Numerical modeling of closely-coupled microstrip transmission lines\",\"authors\":\"J. Bagby\",\"doi\":\"10.1109/SOUTHC.1995.516133\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As integrated circuit feature sizes decrease and clock speeds increase, the problems of coupling between adjacent microstrip transmission lines and devices become more severe. This is especially true in communication circuits, such as pagers and cellular communications devices. In these cases the simultaneous presence of RF and digital circuitry increases the severity of coupling problems. In the paper an integral equation formulation is used to analyze closely-coupled microstrip transmission lines. A method of moments (MOM) solution is implemented utilizing basis functions which incorporate appropriate edge conditions for current components, allowing for close-form evaluation of spatial integrals. In contrast with earlier subdomain basis MOM solutions, greatly improved accuracy is obtained using far fewer terms. Results in the form of propagation factors and current distributions are presented for several modes, and are compared with the results of other techniques. These results are used as a basis to formulate several \\\"rule of thumb\\\" design guides for RF circuits to minimize coupling and cross-talk problems as far as possible. Other strategies for minimizing coupling in RF circuits are also discussed.\",\"PeriodicalId\":341055,\"journal\":{\"name\":\"Proceedings of Southcon '95\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-03-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Southcon '95\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOUTHC.1995.516133\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Southcon '95","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOUTHC.1995.516133","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

随着集成电路特征尺寸的减小和时钟速度的提高,相邻微带传输线和器件之间的耦合问题变得更加严重。在传呼机和蜂窝通信设备等通信电路中尤其如此。在这些情况下,射频和数字电路的同时存在增加了耦合问题的严重性。本文采用积分方程的形式对紧密耦合微带传输线进行了分析。矩量法(MOM)的解决是利用基函数,其中包含适当的边缘条件的当前组件,允许空间积分的密切形式的评估实现。与早期基于子域的MOM解决方案相比,使用更少的项获得了大大提高的精度。给出了几种模式下的传播因子和电流分布形式的结果,并与其他技术的结果进行了比较。这些结果被用作制定射频电路的几个“经验法则”设计指南的基础,以尽可能减少耦合和串扰问题。本文还讨论了射频电路中最小化耦合的其他策略。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Numerical modeling of closely-coupled microstrip transmission lines
As integrated circuit feature sizes decrease and clock speeds increase, the problems of coupling between adjacent microstrip transmission lines and devices become more severe. This is especially true in communication circuits, such as pagers and cellular communications devices. In these cases the simultaneous presence of RF and digital circuitry increases the severity of coupling problems. In the paper an integral equation formulation is used to analyze closely-coupled microstrip transmission lines. A method of moments (MOM) solution is implemented utilizing basis functions which incorporate appropriate edge conditions for current components, allowing for close-form evaluation of spatial integrals. In contrast with earlier subdomain basis MOM solutions, greatly improved accuracy is obtained using far fewer terms. Results in the form of propagation factors and current distributions are presented for several modes, and are compared with the results of other techniques. These results are used as a basis to formulate several "rule of thumb" design guides for RF circuits to minimize coupling and cross-talk problems as far as possible. Other strategies for minimizing coupling in RF circuits are also discussed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信