{"title":"COFDM VHF RX的ACR BER与ATE的相关性","authors":"Peter Sarson","doi":"10.1109/IMS3TW.2015.7177861","DOIUrl":null,"url":null,"abstract":"With a BER to SNR correlation, it was found that it was possible to test ACR in VHF receivers with one measurement. Moving component testing for any device from the bench to ATE poses many challenges, but releasing a high-speed RF device with a design margin issue to a production setting is somewhat challenging. To facilitate the testing of ACR in a production environment, a technique was found that correlated ACR in terms of BER to SNR. This technique, which was developed for ATE, also greatly reduced test time whilst ensuring highly reliable test results.","PeriodicalId":370144,"journal":{"name":"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ACR BER correlation to ATE for a COFDM VHF RX\",\"authors\":\"Peter Sarson\",\"doi\":\"10.1109/IMS3TW.2015.7177861\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With a BER to SNR correlation, it was found that it was possible to test ACR in VHF receivers with one measurement. Moving component testing for any device from the bench to ATE poses many challenges, but releasing a high-speed RF device with a design margin issue to a production setting is somewhat challenging. To facilitate the testing of ACR in a production environment, a technique was found that correlated ACR in terms of BER to SNR. This technique, which was developed for ATE, also greatly reduced test time whilst ensuring highly reliable test results.\",\"PeriodicalId\":370144,\"journal\":{\"name\":\"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMS3TW.2015.7177861\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2015.7177861","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
With a BER to SNR correlation, it was found that it was possible to test ACR in VHF receivers with one measurement. Moving component testing for any device from the bench to ATE poses many challenges, but releasing a high-speed RF device with a design margin issue to a production setting is somewhat challenging. To facilitate the testing of ACR in a production environment, a technique was found that correlated ACR in terms of BER to SNR. This technique, which was developed for ATE, also greatly reduced test time whilst ensuring highly reliable test results.
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