高精度振荡器测量系统的特性

2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) Pub Date : 2017-05-01 DOI:10.23919/MIPRO.2017.7973396

Ivan Brezovec, Marko Magerl, Josip Mikulić, G. Schatzberger, A. Barić

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引用次数: 0

摘要

高精度振荡器的温度稳定性是通过在温度室中的测量来表征的。对于给定的腔室温度，测量两个时间常数:(i)通过测量片上温度传感器的时域电压响应获得的硅达到稳态温度所需的时间;(ii)振荡电路达到稳态频率所需的时间(通过在时域内测量振荡器频率获得)。用于测量腔室温度的温度探头的特征在于其对温度阶跃的响应。基于Allan偏差对测量系统的噪声性能进行了表征。

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Characterization of measurement system for high-precision oscillator measurements

Temperature stability of a high-precision oscillator is characterized by measurements in a temperature chamber. Two time constants are measured for a given temperature of the chamber: (i) time required for the silicon to reach the steady-state temperature obtained by measuring the time-domain voltage response of the on-chip temperature sensor; (ii) time required for the oscillator circuit to reach the steady-state frequency obtained by measuring the oscillator frequency in the time-domain. The temperature probe for measuring the chamber temperature is characterized in terms of its response to a step in temperature. The noise performance of the measurement system is characterized based on Allan deviation.

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2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)

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