用于电磁抗扰度仿真的单片机模块模型

Tao Su, M. Unger, T. Steinecke, Robert Weigel, M. Unger, T. Steinecke
{"title":"用于电磁抗扰度仿真的单片机模块模型","authors":"Tao Su, M. Unger, T. Steinecke, Robert Weigel, M. Unger, T. Steinecke","doi":"10.1109/EMCEUROPE.2008.4786865","DOIUrl":null,"url":null,"abstract":"This paper presents an approach to constructing the immunity model of the microcontroller based on functional blocks. The microcontroller is treated as an assembly of functional blocks and propagation paths of electromagnetic interference. Function blocks are I/Os and cores where the interference propagation paths are referred to interconnections such as packages and on-chip power distribution network (PDN). The model structure and its building blocks are proposed. Their construction methods are presented.","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Block model of microcontroller for electromagnetic immunity simulation\",\"authors\":\"Tao Su, M. Unger, T. Steinecke, Robert Weigel, M. Unger, T. Steinecke\",\"doi\":\"10.1109/EMCEUROPE.2008.4786865\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an approach to constructing the immunity model of the microcontroller based on functional blocks. The microcontroller is treated as an assembly of functional blocks and propagation paths of electromagnetic interference. Function blocks are I/Os and cores where the interference propagation paths are referred to interconnections such as packages and on-chip power distribution network (PDN). The model structure and its building blocks are proposed. Their construction methods are presented.\",\"PeriodicalId\":133902,\"journal\":{\"name\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2008.4786865\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

本文提出了一种基于功能块的单片机免疫模型构建方法。微控制器被看作是功能模块和电磁干扰传播路径的集合。功能块是指I/ o和核,其中干扰传播路径是指互连,如封装和片上配电网络(PDN)。提出了模型的结构和构建模块。介绍了它们的构造方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Block model of microcontroller for electromagnetic immunity simulation
This paper presents an approach to constructing the immunity model of the microcontroller based on functional blocks. The microcontroller is treated as an assembly of functional blocks and propagation paths of electromagnetic interference. Function blocks are I/Os and cores where the interference propagation paths are referred to interconnections such as packages and on-chip power distribution network (PDN). The model structure and its building blocks are proposed. Their construction methods are presented.
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