A. Alwakil, G. Soriano, K. Belkebir, H. Giovannini, S. Arhab
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Direct and iterative inverse wave scattering methods for time-harmonic far-field profilometry
A direct inversion method and two iterative schemes based on a numerical solution of the rigorous forward surface scattering problem are tested and compared for the profilometry of a very rough metallic surface in a context of sparse data.