{"title":"加法器合并DRAM架构","authors":"M. Hashimoto","doi":"10.1109/MTDT.2002.1029768","DOIUrl":null,"url":null,"abstract":"A 4-level sensing scheme utilizing base-4 operation addition and subtraction executable DRAM array has been developed. Neither DRAM functions, performance, nor silicon area will be sacrificed by implementing the circuit. Addition/subtraction will be executed using the massively parallel SIMD, resulting in a high degree of concurrency. Performance of around 50GOPS performance can be achieved in the case where the adder is implemented into 64 Mb DRAM array.","PeriodicalId":230758,"journal":{"name":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Adder merged DRAM architecture\",\"authors\":\"M. Hashimoto\",\"doi\":\"10.1109/MTDT.2002.1029768\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 4-level sensing scheme utilizing base-4 operation addition and subtraction executable DRAM array has been developed. Neither DRAM functions, performance, nor silicon area will be sacrificed by implementing the circuit. Addition/subtraction will be executed using the massively parallel SIMD, resulting in a high degree of concurrency. Performance of around 50GOPS performance can be achieved in the case where the adder is implemented into 64 Mb DRAM array.\",\"PeriodicalId\":230758,\"journal\":{\"name\":\"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.2002.1029768\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2002.1029768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 4-level sensing scheme utilizing base-4 operation addition and subtraction executable DRAM array has been developed. Neither DRAM functions, performance, nor silicon area will be sacrificed by implementing the circuit. Addition/subtraction will be executed using the massively parallel SIMD, resulting in a high degree of concurrency. Performance of around 50GOPS performance can be achieved in the case where the adder is implemented into 64 Mb DRAM array.