J.D. Saussine, D. Hamonic, E. Feuilloley, O. Feuillatre
{"title":"大于100 kGy(Si)的核工业环境用组件的现货选择","authors":"J.D. Saussine, D. Hamonic, E. Feuilloley, O. Feuillatre","doi":"10.1109/RADECS.1999.858619","DOIUrl":null,"url":null,"abstract":"This paper presents total dose test results of Components Off The Shelf (COTS), greater than 100 kGy(Si), for nuclear industry applications. Tested components are bipolar analog integrated circuits (operational amplifiers, regulators) and bipolar logic integrated circuits (TTL-LS and ECL technologies).","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Components off the shelf selection for nuclear industry environment greater than 100 kGy(Si)\",\"authors\":\"J.D. Saussine, D. Hamonic, E. Feuilloley, O. Feuillatre\",\"doi\":\"10.1109/RADECS.1999.858619\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents total dose test results of Components Off The Shelf (COTS), greater than 100 kGy(Si), for nuclear industry applications. Tested components are bipolar analog integrated circuits (operational amplifiers, regulators) and bipolar logic integrated circuits (TTL-LS and ECL technologies).\",\"PeriodicalId\":135784,\"journal\":{\"name\":\"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-09-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.1999.858619\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1999.858619","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Components off the shelf selection for nuclear industry environment greater than 100 kGy(Si)
This paper presents total dose test results of Components Off The Shelf (COTS), greater than 100 kGy(Si), for nuclear industry applications. Tested components are bipolar analog integrated circuits (operational amplifiers, regulators) and bipolar logic integrated circuits (TTL-LS and ECL technologies).