{"title":"在数字测试和产品工程实验课程中使用工业级测试设备","authors":"Christopher Miller, T. Hudson, S. Sipes","doi":"10.1109/MSE.2015.7160006","DOIUrl":null,"url":null,"abstract":"This paper presents a new digital test and product engineering course targeted to undergraduate seniors and master's-level graduate students. Through industrial guided labs, students were able to gain hands-on experience using an industry-grade automatic tester (ATE). Students indicated that the course provided an integration of many of the concepts from their digital core courses, and contributed to the development of skills essential to careers in test engineering or elsewhere.","PeriodicalId":299200,"journal":{"name":"2015 IEEE International Conference on Microelectronics Systems Education (MSE)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using industry-grade test equipment in a digital test and product engineering lab course\",\"authors\":\"Christopher Miller, T. Hudson, S. Sipes\",\"doi\":\"10.1109/MSE.2015.7160006\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new digital test and product engineering course targeted to undergraduate seniors and master's-level graduate students. Through industrial guided labs, students were able to gain hands-on experience using an industry-grade automatic tester (ATE). Students indicated that the course provided an integration of many of the concepts from their digital core courses, and contributed to the development of skills essential to careers in test engineering or elsewhere.\",\"PeriodicalId\":299200,\"journal\":{\"name\":\"2015 IEEE International Conference on Microelectronics Systems Education (MSE)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Conference on Microelectronics Systems Education (MSE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MSE.2015.7160006\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Microelectronics Systems Education (MSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MSE.2015.7160006","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Using industry-grade test equipment in a digital test and product engineering lab course
This paper presents a new digital test and product engineering course targeted to undergraduate seniors and master's-level graduate students. Through industrial guided labs, students were able to gain hands-on experience using an industry-grade automatic tester (ATE). Students indicated that the course provided an integration of many of the concepts from their digital core courses, and contributed to the development of skills essential to careers in test engineering or elsewhere.
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