SOI技术推动了CMOS在射频应用中的极限

J. Raskin
{"title":"SOI技术推动了CMOS在射频应用中的极限","authors":"J. Raskin","doi":"10.1109/SIRF.2016.7445456","DOIUrl":null,"url":null,"abstract":"This last decade Silicon-on-Insulator (SOI) MOSFET technology has demonstrated its potentialities for high frequency commercial applications pushing the limits of CMOS technology. Thanks to the thinning down of the silicon channel, SOI MOSFETs operate in fully depleted regime and short channel effects are under controlled. Besides the gate length downscaling, strain channel engineering is introduced to achieve cutoff frequencies larger than 300 GHz. SOI also presents the major advantage of providing high resistivity substrate capabilities, leading to substantially reduced substrate RF losses, crosstalk and non-linearity. High Resistivity (HR) SOI CMOS is commonly foreseen as the most promising technology for radio frequency integrated circuits and mixed signal applications. Based on several experimental results, the interest, limitations but also possible future improvements of SOI MOS technology are presented.","PeriodicalId":138697,"journal":{"name":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"SOI technology pushes the limits of CMOS for RF applications\",\"authors\":\"J. Raskin\",\"doi\":\"10.1109/SIRF.2016.7445456\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This last decade Silicon-on-Insulator (SOI) MOSFET technology has demonstrated its potentialities for high frequency commercial applications pushing the limits of CMOS technology. Thanks to the thinning down of the silicon channel, SOI MOSFETs operate in fully depleted regime and short channel effects are under controlled. Besides the gate length downscaling, strain channel engineering is introduced to achieve cutoff frequencies larger than 300 GHz. SOI also presents the major advantage of providing high resistivity substrate capabilities, leading to substantially reduced substrate RF losses, crosstalk and non-linearity. High Resistivity (HR) SOI CMOS is commonly foreseen as the most promising technology for radio frequency integrated circuits and mixed signal applications. Based on several experimental results, the interest, limitations but also possible future improvements of SOI MOS technology are presented.\",\"PeriodicalId\":138697,\"journal\":{\"name\":\"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-04-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIRF.2016.7445456\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIRF.2016.7445456","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

在过去的十年中,绝缘体上硅(SOI) MOSFET技术已经证明了其在高频商业应用中的潜力,突破了CMOS技术的极限。由于硅沟道变薄,SOI mosfet在完全耗尽状态下工作,短沟道效应得到控制。除了栅极长度降尺度外,还引入了应变通道工程来实现大于300ghz的截止频率。SOI还具有提供高电阻率衬底能力的主要优势,从而大大降低了衬底射频损耗、串扰和非线性。高电阻率(HR) SOI CMOS通常被认为是射频集成电路和混合信号应用中最有前途的技术。基于几个实验结果,提出了SOI MOS技术的兴趣、局限性以及未来可能的改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SOI technology pushes the limits of CMOS for RF applications
This last decade Silicon-on-Insulator (SOI) MOSFET technology has demonstrated its potentialities for high frequency commercial applications pushing the limits of CMOS technology. Thanks to the thinning down of the silicon channel, SOI MOSFETs operate in fully depleted regime and short channel effects are under controlled. Besides the gate length downscaling, strain channel engineering is introduced to achieve cutoff frequencies larger than 300 GHz. SOI also presents the major advantage of providing high resistivity substrate capabilities, leading to substantially reduced substrate RF losses, crosstalk and non-linearity. High Resistivity (HR) SOI CMOS is commonly foreseen as the most promising technology for radio frequency integrated circuits and mixed signal applications. Based on several experimental results, the interest, limitations but also possible future improvements of SOI MOS technology are presented.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信