VLSI平面设计的轻松模拟回火

J. Cong, T. Kong, D. Xu, F. Liang, Jun S. Liu, W. Wong
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引用次数: 17

摘要

在过去的二十年中,模拟退火技术被认为是处理超大规模集成电路设计中许多NP-hard优化问题的有力方法。最近,人们发明了一种新的蒙特卡罗优化技术——模拟回火,并成功地应用于许多科学问题,从随机场伊辛建模到旅行商问题。它的设计是为了克服模拟退火的缺点,当问题具有粗糙的能量景观时,许多局部极小值被高能量势垒隔开。在本文中,我们成功地将一种松弛的模拟回火方法应用于切片平面设计中,同时考虑了面积和长度的优化。实验结果良好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Relaxed simulated tempering for VLSI floorplan designs
In the past two decades, the simulated annealing technique has been considered as a powerful approach to handle many NP-hard optimization problems in VLSI designs. Recently, a new Monte Carlo and optimization technique, named simulated tempering, was invented and has been successfully applied to many scientific problems, from random field Ising modeling to the traveling salesman problem. It is designed to overcome the drawback in simulated annealing when the problem has a rough energy landscape with many local minima separated by high energy barriers. In this paper, we have successfully applied a version of relaxed simulated tempering to slicing floorplan design with consideration of both area and wirelength optimization. Good experimental results were obtained.
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