集成闭锁保护技术的集成电路单事件闭锁

D.S. Kostyuchenko, A. Karakozov, P. V. Nekrasov, A.A. Pechenkin D.V.Savchenkov, A. Nikiforov
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引用次数: 4

摘要

介绍了内置闭锁保护系统的ADC 7809ALP的测试方法,并给出了测试结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Single event latchup in ICs with integrated latchup protection technology
Test method is described and obtained results presented for ADC 7809ALP with internal latchup protection system.
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