电极对CdTe和PbSe光电器件生成速率的影响

Varun Goel, H. Kumar
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引用次数: 0

摘要

在这项工作中,我们模拟了不同电极对CdTe和PbSe基器件生成速率的影响。器件结构为ITO/TiO2/CdTe或PbSe/电极,其中TiO2与CdTe或PbSe形成异质结。用Au (5.47 eV)、Ni (5.22 eV)、Pt (5.64 eV)、Ti (4.33 eV)等不同做功函数的电极对该器件进行了分析。在归一化光照强度下对器件进行了分析,得到了器件在有源区域(CdTe或PbSe)上谐振行为的产生率。电极变化的影响主要集中在基于CdTe的器件上,该器件在相同波长上的归一化产生率从0.98到0.80不等。而在基于PbSe的器件中,生成率范围为0.99 ~ 0.92。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of Electrodes on Generation Rate of CdTe and PbSe Based Optoelectronic Devices
In this work, we have modeled the effects of different electrodes over the generation rate of the CdTe and PbSe based devices. The device structure used is ITO/TiO2/CdTe or PbSe/Electrodes, where TiO2 forms a heterojunction with CdTe or PbSe. The device is analyzed with different electrodes with different work functions such as Au (5.47 eV), Ni (5.22 eV), Pt (5.64 eV), and Ti (4.33 eV). Under the normalized illumination intensity devices are analyzed and the generation rate is obtained for resonating behavior of the device over the active region (CdTe or PbSe).The effect of electrode variation is mostly dominated over the CdTe based device with a normalized generation rate varying from 0.98 to 0.80 over the same wavelength. Whereas, in PbSe based device the generation rate ranges from 0.99 to 0.92.
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