基于光射线传播预测模型的误差表征

M. Imran, F. Hassan, C. Demetrescu
{"title":"基于光射线传播预测模型的误差表征","authors":"M. Imran, F. Hassan, C. Demetrescu","doi":"10.1109/INMIC.2001.995347","DOIUrl":null,"url":null,"abstract":"This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.","PeriodicalId":286459,"journal":{"name":"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Error characterisation for ray-optic based propagation prediction model\",\"authors\":\"M. Imran, F. Hassan, C. Demetrescu\",\"doi\":\"10.1109/INMIC.2001.995347\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.\",\"PeriodicalId\":286459,\"journal\":{\"name\":\"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-12-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INMIC.2001.995347\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INMIC.2001.995347","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文给出了用阻抗衍射系数和反射系数将建筑物模拟为完全导电或不完全导电的传播模型的误差表征。给出了单建筑场景和多建筑场景的误差表征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Error characterisation for ray-optic based propagation prediction model
This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信