{"title":"基于光射线传播预测模型的误差表征","authors":"M. Imran, F. Hassan, C. Demetrescu","doi":"10.1109/INMIC.2001.995347","DOIUrl":null,"url":null,"abstract":"This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.","PeriodicalId":286459,"journal":{"name":"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Error characterisation for ray-optic based propagation prediction model\",\"authors\":\"M. Imran, F. Hassan, C. Demetrescu\",\"doi\":\"10.1109/INMIC.2001.995347\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.\",\"PeriodicalId\":286459,\"journal\":{\"name\":\"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-12-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INMIC.2001.995347\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INMIC.2001.995347","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Error characterisation for ray-optic based propagation prediction model
This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.