面向NPSF内存内置自检的新测试模式生成单元

ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) Pub Date : 2001-09-02 DOI:10.1109/ICECS.2001.957583

A. Chrisanthopoulos, T. Haniotakis, Y. Tsiatouhas, A. Arapoyanni

{"title":"面向NPSF内存内置自检的新测试模式生成单元","authors":"A. Chrisanthopoulos, T. Haniotakis, Y. Tsiatouhas, A. Arapoyanni","doi":"10.1109/ICECS.2001.957583","DOIUrl":null,"url":null,"abstract":"In this paper we present the design of deterministic test pattern generation (TPG) units which can be exploited in a built-in self-test (BIST) scheme for memory neighborhood pattern sensitive fault (NPSF) testing. The proposed TPG units generate the required Eulerian sequence of test patterns for memory type-1 NPSF testing.","PeriodicalId":141392,"journal":{"name":"ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"New test pattern generation units for NPSF oriented memory built-in self test\",\"authors\":\"A. Chrisanthopoulos, T. Haniotakis, Y. Tsiatouhas, A. Arapoyanni\",\"doi\":\"10.1109/ICECS.2001.957583\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we present the design of deterministic test pattern generation (TPG) units which can be exploited in a built-in self-test (BIST) scheme for memory neighborhood pattern sensitive fault (NPSF) testing. The proposed TPG units generate the required Eulerian sequence of test patterns for memory type-1 NPSF testing.\",\"PeriodicalId\":141392,\"journal\":{\"name\":\"ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-09-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.2001.957583\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2001.957583","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 7

摘要

本文提出了一种确定性测试模式生成(TPG)单元的设计，该单元可用于内存邻域模式敏感故障(NPSF)测试的内置自检(BIST)方案。所建议的TPG单元为内存类型-1 NPSF测试生成所需的欧拉测试模式序列。

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New test pattern generation units for NPSF oriented memory built-in self test

In this paper we present the design of deterministic test pattern generation (TPG) units which can be exploited in a built-in self-test (BIST) scheme for memory neighborhood pattern sensitive fault (NPSF) testing. The proposed TPG units generate the required Eulerian sequence of test patterns for memory type-1 NPSF testing.

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ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483)

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