双极线性微电路最近的总剂量数据汇编

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1996-07-19 DOI:10.1109/REDW.1996.574185

R. Pease, W. Combs, A. Johnston, T. Carrière, C. Poivey, A. Gach, S. McClure

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引用次数: 47

摘要

许多用于空间系统的传统双极线性微电路显示出对总剂量退化的剂量率敏感性。若干机构收集的剂量率数据已被合并，并以固定剂量下的敏感参数移位和剂量率增强因子的形式提出。

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A compendium of recent total dose data on bipolar linear microcircuits

Many conventional bipolar linear microcircuits used in space systems have shown a dose rate sensitivity to total dose degradation. Dose rate data, taken by several agencies, have been combined and presented in terms of sensitive parameter shifts at a fixed dose and dose rate enhancements factors.

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1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference

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