{"title":"一种在回流焊过程中实现无裂纹塑料封装的新结构——芯片侧支撑封装的开发","authors":"T. Nakazawa, Y. Unoue, K. Sawada, T. Sudo","doi":"10.1109/IEMT.1995.526180","DOIUrl":null,"url":null,"abstract":"Reports a novel structure of a plastic package without a die-pad whereby adhesion strength is improved and thermal stress reduced. The non-die-pad structure has been realized by the chip side support (CSS) method. Furthermore, this paper describes the derivation of an equation that can be used as a criterion for judging package cracking or delamination by comparing the shear strength with the shear stress. The equation for shear stress can be estimated by the finite element method.","PeriodicalId":123707,"journal":{"name":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel structure to realize crack-free plastic package during reflow soldering process-development of CSS (chip side support) package\",\"authors\":\"T. Nakazawa, Y. Unoue, K. Sawada, T. Sudo\",\"doi\":\"10.1109/IEMT.1995.526180\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reports a novel structure of a plastic package without a die-pad whereby adhesion strength is improved and thermal stress reduced. The non-die-pad structure has been realized by the chip side support (CSS) method. Furthermore, this paper describes the derivation of an equation that can be used as a criterion for judging package cracking or delamination by comparing the shear strength with the shear stress. The equation for shear stress can be estimated by the finite element method.\",\"PeriodicalId\":123707,\"journal\":{\"name\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1995.526180\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium. 'Manufacturing Technologies - Present and Future'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1995.526180","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel structure to realize crack-free plastic package during reflow soldering process-development of CSS (chip side support) package
Reports a novel structure of a plastic package without a die-pad whereby adhesion strength is improved and thermal stress reduced. The non-die-pad structure has been realized by the chip side support (CSS) method. Furthermore, this paper describes the derivation of an equation that can be used as a criterion for judging package cracking or delamination by comparing the shear strength with the shear stress. The equation for shear stress can be estimated by the finite element method.