{"title":"透视式宽禁带半导体晶体管损耗识别评估系统","authors":"M. Pipíška, P. Sojka, J. Šedo","doi":"10.1109/EPE.2019.8777998","DOIUrl":null,"url":null,"abstract":"The paper presents a system for measuring switching and conductivity losses for different types of transistors. The measurement system is composed of hardware and software that evaluates the total transistor losses from instantaneous values. The hardware part consists of a test board that includes a power supply, transistor driver, measurement points, transistor, freewheel diode and oscilloscope. The software part (GUI) is done in Matlab, which displays the measured voltage and current waveforms and the calculated transistor losses. The result of the article is the measured loss values at different switching frequencies and power.","PeriodicalId":117212,"journal":{"name":"2019 20th International Scientific Conference on Electric Power Engineering (EPE)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Evaluation system for power loss identification of perspective wide bandgap semiconductor transistors\",\"authors\":\"M. Pipíška, P. Sojka, J. Šedo\",\"doi\":\"10.1109/EPE.2019.8777998\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a system for measuring switching and conductivity losses for different types of transistors. The measurement system is composed of hardware and software that evaluates the total transistor losses from instantaneous values. The hardware part consists of a test board that includes a power supply, transistor driver, measurement points, transistor, freewheel diode and oscilloscope. The software part (GUI) is done in Matlab, which displays the measured voltage and current waveforms and the calculated transistor losses. The result of the article is the measured loss values at different switching frequencies and power.\",\"PeriodicalId\":117212,\"journal\":{\"name\":\"2019 20th International Scientific Conference on Electric Power Engineering (EPE)\",\"volume\":\"71 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 20th International Scientific Conference on Electric Power Engineering (EPE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPE.2019.8777998\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Scientific Conference on Electric Power Engineering (EPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPE.2019.8777998","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation system for power loss identification of perspective wide bandgap semiconductor transistors
The paper presents a system for measuring switching and conductivity losses for different types of transistors. The measurement system is composed of hardware and software that evaluates the total transistor losses from instantaneous values. The hardware part consists of a test board that includes a power supply, transistor driver, measurement points, transistor, freewheel diode and oscilloscope. The software part (GUI) is done in Matlab, which displays the measured voltage and current waveforms and the calculated transistor losses. The result of the article is the measured loss values at different switching frequencies and power.