透视式宽禁带半导体晶体管损耗识别评估系统

M. Pipíška, P. Sojka, J. Šedo
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引用次数: 2

摘要

本文介绍了一种测量不同类型晶体管开关损耗和电导率损耗的系统。该测量系统由硬件和软件组成,从瞬时值计算晶体管总损耗。硬件部分由测试板组成,测试板包括电源、晶体管驱动器、测量点、晶体管、自由轮二极管和示波器。软件部分(GUI)是在Matlab中完成的,显示了测量的电压和电流波形以及计算的晶体管损耗。本文的结果是在不同的开关频率和功率下测量的损耗值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation system for power loss identification of perspective wide bandgap semiconductor transistors
The paper presents a system for measuring switching and conductivity losses for different types of transistors. The measurement system is composed of hardware and software that evaluates the total transistor losses from instantaneous values. The hardware part consists of a test board that includes a power supply, transistor driver, measurement points, transistor, freewheel diode and oscilloscope. The software part (GUI) is done in Matlab, which displays the measured voltage and current waveforms and the calculated transistor losses. The result of the article is the measured loss values at different switching frequencies and power.
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