具有事件累积问题的辐射下存储器MBU分布的计算方法

2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI:10.1109/RADECS.2008.5782750

P. Reviriego, J. A. Maestro

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引用次数: 8

摘要

当辐射存储器时，seu /MBUs倾向于积累，使得难以描述影响系统的事件和错误模式的数量。本文提出了一种解决这一问题的方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A technique to calculate the MBU distribution of a memory under radiation suffering the event accumulation problem

When radiating memories, SEUs/MBUs tend to accumulate, making difficult to characterize the number of events and error patterns that have affected the system. A technique to deal with this problem is presented in this paper.

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2008 European Conference on Radiation and Its Effects on Components and Systems

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