{"title":"关于测试时序推测电路","authors":"F. Yuan, Yannan Liu, W. Jone, Q. Xu","doi":"10.1145/2463209.2488771","DOIUrl":null,"url":null,"abstract":"By allowing the occurrence of infrequent timing errors and correcting them online, circuit-level timing speculation is one of the most promising variation-tolerant design techniques. How to effectively test timing-speculative circuits, however, has not been addressed in the literature. This is a challenging problem because conventional scan techniques cannot provide sufficient controllability and observability for such circuits. In this paper, we propose novel techniques to achieve high fault coverage for timing-speculative circuits without incurring high design-for-testability cost. Experimental results on various benchmark circuits demonstrate the effectiveness of the proposed solution.","PeriodicalId":320207,"journal":{"name":"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"On testing timing-speculative circuits\",\"authors\":\"F. Yuan, Yannan Liu, W. Jone, Q. Xu\",\"doi\":\"10.1145/2463209.2488771\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"By allowing the occurrence of infrequent timing errors and correcting them online, circuit-level timing speculation is one of the most promising variation-tolerant design techniques. How to effectively test timing-speculative circuits, however, has not been addressed in the literature. This is a challenging problem because conventional scan techniques cannot provide sufficient controllability and observability for such circuits. In this paper, we propose novel techniques to achieve high fault coverage for timing-speculative circuits without incurring high design-for-testability cost. Experimental results on various benchmark circuits demonstrate the effectiveness of the proposed solution.\",\"PeriodicalId\":320207,\"journal\":{\"name\":\"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2463209.2488771\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2463209.2488771","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
By allowing the occurrence of infrequent timing errors and correcting them online, circuit-level timing speculation is one of the most promising variation-tolerant design techniques. How to effectively test timing-speculative circuits, however, has not been addressed in the literature. This is a challenging problem because conventional scan techniques cannot provide sufficient controllability and observability for such circuits. In this paper, we propose novel techniques to achieve high fault coverage for timing-speculative circuits without incurring high design-for-testability cost. Experimental results on various benchmark circuits demonstrate the effectiveness of the proposed solution.