{"title":"ESD测试的一些基本方面","authors":"R. Keenan, L. A. Rosi","doi":"10.1109/ISEMC.1991.148226","DOIUrl":null,"url":null,"abstract":"Transmission line and antenna views of electrostatic discharge (ESD) testing are presented. It is determined that positioning of an ESD gun's ground strap and the mechanical design of an ESD gun and ground strap affect the rise time of current injected into equipment during ESD testing. That rise time affects voltage induced in circuit loops, the dominant cause of ESD-induced upsets in fielded equipment. Ground strap positioning also affects the ESD-induced electromagnetic field in the interior of unshielded equipment, with closer positioning parallel to the gun rod reducing test severity.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":"{\"title\":\"Some fundamental aspects of ESD testing\",\"authors\":\"R. Keenan, L. A. Rosi\",\"doi\":\"10.1109/ISEMC.1991.148226\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transmission line and antenna views of electrostatic discharge (ESD) testing are presented. It is determined that positioning of an ESD gun's ground strap and the mechanical design of an ESD gun and ground strap affect the rise time of current injected into equipment during ESD testing. That rise time affects voltage induced in circuit loops, the dominant cause of ESD-induced upsets in fielded equipment. Ground strap positioning also affects the ESD-induced electromagnetic field in the interior of unshielded equipment, with closer positioning parallel to the gun rod reducing test severity.<<ETX>>\",\"PeriodicalId\":243730,\"journal\":{\"name\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-08-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"28\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1991.148226\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1991 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1991.148226","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transmission line and antenna views of electrostatic discharge (ESD) testing are presented. It is determined that positioning of an ESD gun's ground strap and the mechanical design of an ESD gun and ground strap affect the rise time of current injected into equipment during ESD testing. That rise time affects voltage induced in circuit loops, the dominant cause of ESD-induced upsets in fielded equipment. Ground strap positioning also affects the ESD-induced electromagnetic field in the interior of unshielded equipment, with closer positioning parallel to the gun rod reducing test severity.<>