使用s参数测量准确和完整的频率相关传输线特性

T. Winkel
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引用次数: 2

摘要

提出了一个非常准确和完整的互连表征。该方法基于对两条不同长度的线进行高频s参数测量。通过三个附加测量,考虑了测量探头接触结构的影响。对硅衬底上的测量结果和计算结果进行了比较,结果非常吻合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An accurate and complete frequency dependent transmission line characterization using S-parameter measurements
A very accurate and complete characterization of interconnects is presented. The method is based upon high-frequency S-parameter measurements of two lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. A comparison of results obtained from measurements on a silicon substrate and from calculations is given and shows excellent agreement.
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