Qingyu Chen, D. Hiemstra, Haibin Wang, Li Chen, V. Kirischian
{"title":"KeyStone II片上系统(SoC) 66AK2L06 DSP核的高能质子辐照结果","authors":"Qingyu Chen, D. Hiemstra, Haibin Wang, Li Chen, V. Kirischian","doi":"10.1109/NSREC.2017.8115447","DOIUrl":null,"url":null,"abstract":"Vroton induced SEU cross-section of DSP cores within the KeyStone™ II system-on-chip 66AK2L06 is presented. Upset rates in the space radiation environment are estimated.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High energy proton irradiation results for the DSP cores of the KeyStone II system-on-chip (SoC) 66AK2L06\",\"authors\":\"Qingyu Chen, D. Hiemstra, Haibin Wang, Li Chen, V. Kirischian\",\"doi\":\"10.1109/NSREC.2017.8115447\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Vroton induced SEU cross-section of DSP cores within the KeyStone™ II system-on-chip 66AK2L06 is presented. Upset rates in the space radiation environment are estimated.\",\"PeriodicalId\":284506,\"journal\":{\"name\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"83 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2017.8115447\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115447","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High energy proton irradiation results for the DSP cores of the KeyStone II system-on-chip (SoC) 66AK2L06
Vroton induced SEU cross-section of DSP cores within the KeyStone™ II system-on-chip 66AK2L06 is presented. Upset rates in the space radiation environment are estimated.