先进的大电流、高可靠性IGBT模块,采用改进的多芯片结构

R. Saito, Y. Koike, A. Tanaka, T. Kushima, H. Shimizu, S. Nonoyama
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引用次数: 5

摘要

提出了实现高可靠性和大电流性能的先进IGBT模块技术。验证了该低热膨胀基模块的6万次长期功率循环能力。应力释放高安装结构和陶瓷金属拉回结构被证明是高热循环能力必不可少的。采用多芯片衬底的多端主终端和高电阻率感应发射极终端技术,实现了大功率模块的大电流能力和均匀性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Advanced high current, high reliable IGBT module with improved multi-chip structure
Advanced IGBT module technology to realize high reliability and high current capability was presented. The 60,000 cycles long term power cycle capability of the low thermal expansion base module was demonstrated. A stress release tall mounting structure and a ceramic metal pull back structure were shown to be essential for high thermal cycle capability. A multi-end main terminal with multichip substrate and high resistivity sense emitter terminal technology was applied to realize high current capability and uniformity in the large high power module.
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