研究NEM继电器器件定尺的二维解析模型

Xiaoying Shen, S. Chong, Daesung Lee, R. Parsa, R. Howe, H. Wong
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引用次数: 6

摘要

NEM继电器是克服CMOS电路功率危机的一种很有前途的器件。为了设计这些器件并预测它们的标度特性,一个强调继电器操作基本物理的分析模型是非常需要的。本文提出了一种新的二维解析模型,用于研究NEM继电器的标度。该模型保留了NEM继电器的物理见解,但具有接近常用1D模型的简单性。与有限元模型相比,通过引入比率R(a)来考虑1D公式中的2D效应,误差从~ 25% (1D模型)减少到~ 3%(本工作)。除了基本的机械和电气性能外,该模型还考虑了NEM继电器装置运行时的表面力。讨论了当器件按比例缩小时,表面力对工作电压的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
2D analytical model for the study of NEM relay device scaling
NEM relay is a promising class of device to overcome the power crisis of CMOS circuits. To design these devices and predict their scaling properties, an analytical model highlighting the fundamental physics of the relay operation is highly desired. This work presents a new 2D analytical model for the study of NEM relay scaling. The model retains the physical insights for NEM relays and yet has the simplicity close to the commonly used 1D model. The error as compared to a finite element model is reduced from ∼25% (1D model) to ∼3% (this work) by introducing a ratio R(a) to account for 2D effects in the 1D formulation. Besides the fundamental mechanical and electrical properties, the model also takes into account surface forces in the operation of NEM relay devices. The impact of surface forces on the operation voltage as devices are scaled down is discussed.
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