RSoC结构重构后电路性能的快速评估方法

V. M. Khvatov
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引用次数: 0

摘要

在集成电路设计流程中使用可重构的片上系统逻辑元件重新合成,需要有完整的元件基础来进行静态时序分析。如果库元素基于LUT,那么描述整个库可能会花费大量时间。本文提出了一种不需要对完整的电路库进行表征就能快速评估结构再合成后电路性能的方法。它包括LUT元素的初始表征和库的动态生成,其中仅包括作为逻辑合成结果获得的细胞的时间参数。该方法可以考虑到逻辑元件的所有结构变化,并在没有临界精度损失的情况下执行静态定时分析。生成库中元素的延迟与特征库的最大差异为5%,输出转换时间最大差异为0.013%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Method for Fast Evaluation of the Circuit Performance After Structural Resynthesis for RSoC
The use of reconfigurable system-on-chip logic element re-synthesis in the integrated circuit design flow requires a complete element basis to perform static timing analysis. If the library element is based on a LUT, then characterizing the full library can take a significant amount of time.This paper presents a method for fast evaluation of the circuit performance after structural re-synthesis, which does not require the characterization of the complete library. It consists of initial characterization of the LUT element and dynamic generation of the library, which includes only the temporal parameters of the cells that were obtained as a result of logical synthesis. The method makes it possible to take into account all structural changes in a logic element and perform a static timing analysis without a critical loss of accuracy. The delay of the elements in the generated libraries differs from the characterized libraries by a maximum of 5% and the output transition time by 0.013%.
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