使用非线性纠错码保护存储器免受随机错误和故障注入攻击

Shizun Ge, Zhen Wang, Pei Luo, M. Karpovsky
{"title":"使用非线性纠错码保护存储器免受随机错误和故障注入攻击","authors":"Shizun Ge, Zhen Wang, Pei Luo, M. Karpovsky","doi":"10.1145/2487726.2487731","DOIUrl":null,"url":null,"abstract":"Memories used in cryptographic devices are vulnerable to fault injection attacks. To mitigate the danger of these attacks, error control codes are often used in memories to detect maliciously injected faults. Most of codes proposed for memories in cryptographic devices are error detecting codes with small Hamming distances that cannot be used for error correction. While being able to provide sufficient protection against fault injection attacks, these codes cannot provide a satisfactory reliability under the presence of random errors. In this paper we present reliable and secure memory architectures based on two nonlinear error correcting codes. The presented coding technique can be used for detection of fault injection attacks as well as for correction of random errors. The construction and the error correction procedures for the code will be described. The error handling methodology used to distinguish between random errors and maliciously injected faults will be discussed.","PeriodicalId":141766,"journal":{"name":"Hardware and Architectural Support for Security and Privacy","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Secure memories resistant to both random errors and fault injection attacks using nonlinear error correction codes\",\"authors\":\"Shizun Ge, Zhen Wang, Pei Luo, M. Karpovsky\",\"doi\":\"10.1145/2487726.2487731\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Memories used in cryptographic devices are vulnerable to fault injection attacks. To mitigate the danger of these attacks, error control codes are often used in memories to detect maliciously injected faults. Most of codes proposed for memories in cryptographic devices are error detecting codes with small Hamming distances that cannot be used for error correction. While being able to provide sufficient protection against fault injection attacks, these codes cannot provide a satisfactory reliability under the presence of random errors. In this paper we present reliable and secure memory architectures based on two nonlinear error correcting codes. The presented coding technique can be used for detection of fault injection attacks as well as for correction of random errors. The construction and the error correction procedures for the code will be described. The error handling methodology used to distinguish between random errors and maliciously injected faults will be discussed.\",\"PeriodicalId\":141766,\"journal\":{\"name\":\"Hardware and Architectural Support for Security and Privacy\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Hardware and Architectural Support for Security and Privacy\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2487726.2487731\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Hardware and Architectural Support for Security and Privacy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2487726.2487731","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

加密设备中使用的存储器容易受到故障注入攻击。为了减轻这些攻击的危险,错误控制码通常在存储器中使用,以检测恶意注入的错误。大多数用于加密设备中存储器的编码都是具有小汉明距离的错误检测码,不能用于纠错。虽然这些代码能够提供足够的保护,防止错误注入攻击,但在随机错误存在的情况下,这些代码不能提供令人满意的可靠性。本文提出了一种基于非线性纠错码的可靠、安全的存储器结构。所提出的编码技术可用于故障注入攻击的检测和随机错误的校正。本文将描述该代码的构造和纠错程序。本文将讨论用于区分随机错误和恶意注入错误的错误处理方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Secure memories resistant to both random errors and fault injection attacks using nonlinear error correction codes
Memories used in cryptographic devices are vulnerable to fault injection attacks. To mitigate the danger of these attacks, error control codes are often used in memories to detect maliciously injected faults. Most of codes proposed for memories in cryptographic devices are error detecting codes with small Hamming distances that cannot be used for error correction. While being able to provide sufficient protection against fault injection attacks, these codes cannot provide a satisfactory reliability under the presence of random errors. In this paper we present reliable and secure memory architectures based on two nonlinear error correcting codes. The presented coding technique can be used for detection of fault injection attacks as well as for correction of random errors. The construction and the error correction procedures for the code will be described. The error handling methodology used to distinguish between random errors and maliciously injected faults will be discussed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信