{"title":"以0.5 /spl mu/m CMOS工艺制造的300 MHz, 3.3 V 1 Mb SRAM","authors":"H. Pilo, S. Lamphier, F. Towler, R. Hee","doi":"10.1109/ISSCC.1996.488547","DOIUrl":null,"url":null,"abstract":"A 300 MHz, 1 Mb SRAM with 5.4 ns access in 3.3 V, 0.5 /spl mu/m CMOS uses self-timed and self-resetting circuits. A dual-clock, flow-through read protocol optimizes data window control and a 750 ps setup-and-hold window for all input signals is achieved through floorplanning, receiver design and localized input-signal registering. The SRAM interfaces with high-speed transceiver logic (HSTL) levels through high-speed, noise-tolerant receivers. Programmable impedance output drivers for HSTL interfaces match transmission line impedance to within 10% tolerances over process, voltage and temperature variations.","PeriodicalId":162539,"journal":{"name":"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-02-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A 300 MHz, 3.3 V 1 Mb SRAM fabricated in a 0.5 /spl mu/m CMOS process\",\"authors\":\"H. Pilo, S. Lamphier, F. Towler, R. Hee\",\"doi\":\"10.1109/ISSCC.1996.488547\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 300 MHz, 1 Mb SRAM with 5.4 ns access in 3.3 V, 0.5 /spl mu/m CMOS uses self-timed and self-resetting circuits. A dual-clock, flow-through read protocol optimizes data window control and a 750 ps setup-and-hold window for all input signals is achieved through floorplanning, receiver design and localized input-signal registering. The SRAM interfaces with high-speed transceiver logic (HSTL) levels through high-speed, noise-tolerant receivers. Programmable impedance output drivers for HSTL interfaces match transmission line impedance to within 10% tolerances over process, voltage and temperature variations.\",\"PeriodicalId\":162539,\"journal\":{\"name\":\"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-02-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1996.488547\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1996.488547","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 300 MHz, 3.3 V 1 Mb SRAM fabricated in a 0.5 /spl mu/m CMOS process
A 300 MHz, 1 Mb SRAM with 5.4 ns access in 3.3 V, 0.5 /spl mu/m CMOS uses self-timed and self-resetting circuits. A dual-clock, flow-through read protocol optimizes data window control and a 750 ps setup-and-hold window for all input signals is achieved through floorplanning, receiver design and localized input-signal registering. The SRAM interfaces with high-speed transceiver logic (HSTL) levels through high-speed, noise-tolerant receivers. Programmable impedance output drivers for HSTL interfaces match transmission line impedance to within 10% tolerances over process, voltage and temperature variations.