A. Ortiz-Conde, Y. Ma, J. Thomson, E. Santos, J. J. Liou, F. Sánchez, M. Lei, J. Finol, P. Layman
{"title":"参数提取采用横向和纵向优化","authors":"A. Ortiz-Conde, Y. Ma, J. Thomson, E. Santos, J. J. Liou, F. Sánchez, M. Lei, J. Finol, P. Layman","doi":"10.1109/ICMEL.2000.840546","DOIUrl":null,"url":null,"abstract":"We revisited the direct lateral optimization method, which is based on the approach of minimizing the error on the lateral axis. We compare the efficiency and robustness of the widely used vertical optimization and the present lateral optimization methods.","PeriodicalId":215956,"journal":{"name":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Parameter extraction using lateral and vertical optimization\",\"authors\":\"A. Ortiz-Conde, Y. Ma, J. Thomson, E. Santos, J. J. Liou, F. Sánchez, M. Lei, J. Finol, P. Layman\",\"doi\":\"10.1109/ICMEL.2000.840546\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We revisited the direct lateral optimization method, which is based on the approach of minimizing the error on the lateral axis. We compare the efficiency and robustness of the widely used vertical optimization and the present lateral optimization methods.\",\"PeriodicalId\":215956,\"journal\":{\"name\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"volume\":\"120 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMEL.2000.840546\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2000.840546","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Parameter extraction using lateral and vertical optimization
We revisited the direct lateral optimization method, which is based on the approach of minimizing the error on the lateral axis. We compare the efficiency and robustness of the widely used vertical optimization and the present lateral optimization methods.