功能安全背景下基于故障注入的AMS电路仿真故障分组

Özlem Karaca, Jérôme Kirscher, A. Laroche, Andreas Tributsch, L. Maurer, G. Pelz
{"title":"功能安全背景下基于故障注入的AMS电路仿真故障分组","authors":"Özlem Karaca, Jérôme Kirscher, A. Laroche, Andreas Tributsch, L. Maurer, G. Pelz","doi":"10.1109/SMACD.2016.7520721","DOIUrl":null,"url":null,"abstract":"The fault injection technique is utilized for simulation-based verification of safety-related analog and mixed-signal (AMS) circuits for compliance with safety requirements in the presence of hardware faults. Exhaustive fault simulation is very time consuming with respect to the number of faults to simulate at circuit level. For efficient simulation-based verification, a fault grouping approach is proposed to reduce the number of faults to simulate without missing out potentially safety-critical faults. The fault grouping approach is based on component-level fault simulation, hierarchical clustering and internal cluster validation. The effectiveness is investigated on a component extracted from an automotive safety-related System on a Chip.","PeriodicalId":441203,"journal":{"name":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"113 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Fault grouping for fault injection based simulation of AMS circuits in the context of functional safety\",\"authors\":\"Özlem Karaca, Jérôme Kirscher, A. Laroche, Andreas Tributsch, L. Maurer, G. Pelz\",\"doi\":\"10.1109/SMACD.2016.7520721\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The fault injection technique is utilized for simulation-based verification of safety-related analog and mixed-signal (AMS) circuits for compliance with safety requirements in the presence of hardware faults. Exhaustive fault simulation is very time consuming with respect to the number of faults to simulate at circuit level. For efficient simulation-based verification, a fault grouping approach is proposed to reduce the number of faults to simulate without missing out potentially safety-critical faults. The fault grouping approach is based on component-level fault simulation, hierarchical clustering and internal cluster validation. The effectiveness is investigated on a component extracted from an automotive safety-related System on a Chip.\",\"PeriodicalId\":441203,\"journal\":{\"name\":\"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"volume\":\"113 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMACD.2016.7520721\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD.2016.7520721","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

摘要

故障注入技术用于基于仿真的安全相关模拟和混合信号(AMS)电路的验证,以确保在存在硬件故障的情况下符合安全要求。穷举故障仿真由于需要在电路级模拟的故障数量较多,非常耗时。为了有效地进行仿真验证,提出了一种故障分组方法,以减少需要模拟的故障数量,同时又不会遗漏潜在的安全关键故障。故障分组方法基于组件级故障仿真、分层聚类和内部聚类验证。以某汽车安全相关芯片上系统为例,研究了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fault grouping for fault injection based simulation of AMS circuits in the context of functional safety
The fault injection technique is utilized for simulation-based verification of safety-related analog and mixed-signal (AMS) circuits for compliance with safety requirements in the presence of hardware faults. Exhaustive fault simulation is very time consuming with respect to the number of faults to simulate at circuit level. For efficient simulation-based verification, a fault grouping approach is proposed to reduce the number of faults to simulate without missing out potentially safety-critical faults. The fault grouping approach is based on component-level fault simulation, hierarchical clustering and internal cluster validation. The effectiveness is investigated on a component extracted from an automotive safety-related System on a Chip.
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