{"title":"基于小波的光纤连接器表面缺陷检测","authors":"A. Rehman, W. Bin Mozaffar","doi":"10.1109/ICIET.2007.4381337","DOIUrl":null,"url":null,"abstract":"In this paper, a wavelet-based surface defect detection of optical fiber ferrules is proposed. Surface defects on optical fiber connectors can be damaging to passing signals when coupled with other connectors. Our quality control enhancement work is a visual control stage, using magnified images, whereby morphological operations segment the image and wavelet transforms then detect defects on optical fiber connector surfaces to improve the overall acceptability of the manufactured components.","PeriodicalId":167980,"journal":{"name":"2007 International Conference on Information and Emerging Technologies","volume":"1999 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Optical Fiber Connector Surface Defect Detection Using Wavelets\",\"authors\":\"A. Rehman, W. Bin Mozaffar\",\"doi\":\"10.1109/ICIET.2007.4381337\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a wavelet-based surface defect detection of optical fiber ferrules is proposed. Surface defects on optical fiber connectors can be damaging to passing signals when coupled with other connectors. Our quality control enhancement work is a visual control stage, using magnified images, whereby morphological operations segment the image and wavelet transforms then detect defects on optical fiber connector surfaces to improve the overall acceptability of the manufactured components.\",\"PeriodicalId\":167980,\"journal\":{\"name\":\"2007 International Conference on Information and Emerging Technologies\",\"volume\":\"1999 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 International Conference on Information and Emerging Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIET.2007.4381337\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Conference on Information and Emerging Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIET.2007.4381337","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optical Fiber Connector Surface Defect Detection Using Wavelets
In this paper, a wavelet-based surface defect detection of optical fiber ferrules is proposed. Surface defects on optical fiber connectors can be damaging to passing signals when coupled with other connectors. Our quality control enhancement work is a visual control stage, using magnified images, whereby morphological operations segment the image and wavelet transforms then detect defects on optical fiber connector surfaces to improve the overall acceptability of the manufactured components.