用于射频功率应用的SOA技术中的新型垂直DMOS晶体管

N. Nenadovic, V. Cuoco, S. Theeuwen, L. Nanver, H. Jos, J. Slotboom
{"title":"用于射频功率应用的SOA技术中的新型垂直DMOS晶体管","authors":"N. Nenadovic, V. Cuoco, S. Theeuwen, L. Nanver, H. Jos, J. Slotboom","doi":"10.1109/MIEL.2002.1003164","DOIUrl":null,"url":null,"abstract":"A novel SOI vertical DMOS transistor on glass for RF power applications is proposed. The device has the same advantages as conventional LDMOS transistors over bipolar transistors with respect to the linearity and efficiency for the high-power, high-frequency applications and adds the advantages of silicon-on-anything technology for the integration with high quality passive components. The gate oxide degradation due to hot carrier generation is inherently eliminated. The metalization on the wafer back includes copper electroplating. A thick copper layer on the wafer back serves as an excellent heat spreader and heat sink. Moreover, it can be used to avoid debiasing due to voltage drops over the metalization. The device performance has been investigated using DC and AC MEDICI simulations and the \"Smoothie\" database model for FET devices. A device with a breakdown of more than 80 V, an f/sub Tmax/ of 8 GHz, a maximum current of more than 10/sup -4/ A//spl mu/m at V/sub DS/=26 V and an R/sub ON/ of 4m/spl Omega/cm/sup 2/ is demonstrated.","PeriodicalId":221518,"journal":{"name":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A novel vertical DMOS transistor in SOA technology for RF-power applications\",\"authors\":\"N. Nenadovic, V. Cuoco, S. Theeuwen, L. Nanver, H. Jos, J. Slotboom\",\"doi\":\"10.1109/MIEL.2002.1003164\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel SOI vertical DMOS transistor on glass for RF power applications is proposed. The device has the same advantages as conventional LDMOS transistors over bipolar transistors with respect to the linearity and efficiency for the high-power, high-frequency applications and adds the advantages of silicon-on-anything technology for the integration with high quality passive components. The gate oxide degradation due to hot carrier generation is inherently eliminated. The metalization on the wafer back includes copper electroplating. A thick copper layer on the wafer back serves as an excellent heat spreader and heat sink. Moreover, it can be used to avoid debiasing due to voltage drops over the metalization. The device performance has been investigated using DC and AC MEDICI simulations and the \\\"Smoothie\\\" database model for FET devices. A device with a breakdown of more than 80 V, an f/sub Tmax/ of 8 GHz, a maximum current of more than 10/sup -4/ A//spl mu/m at V/sub DS/=26 V and an R/sub ON/ of 4m/spl Omega/cm/sup 2/ is demonstrated.\",\"PeriodicalId\":221518,\"journal\":{\"name\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2002.1003164\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2002.1003164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

提出了一种新型的基于玻璃的SOI垂直DMOS晶体管。该器件与传统LDMOS晶体管相比,在高功率、高频应用的线性度和效率方面具有与双极晶体管相同的优势,并增加了与高质量无源元件集成的任何硅技术的优势。由于热载流子产生的栅极氧化物降解是固有的消除。晶圆背面的金属化包括镀铜。晶圆背面的厚铜层起到了良好的散热和散热作用。此外,它可以用来避免由于金属化上的电压降而产生的去偏。利用直流和交流MEDICI仿真以及FET器件的“Smoothie”数据库模型对器件性能进行了研究。演示了一种击穿大于80v, f/sub Tmax/为8ghz,在V/sub DS/=26 V时最大电流大于10/sup -4/ A//spl mu/m, R/sub ON/为4m/spl Omega/cm/sup 2/的器件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel vertical DMOS transistor in SOA technology for RF-power applications
A novel SOI vertical DMOS transistor on glass for RF power applications is proposed. The device has the same advantages as conventional LDMOS transistors over bipolar transistors with respect to the linearity and efficiency for the high-power, high-frequency applications and adds the advantages of silicon-on-anything technology for the integration with high quality passive components. The gate oxide degradation due to hot carrier generation is inherently eliminated. The metalization on the wafer back includes copper electroplating. A thick copper layer on the wafer back serves as an excellent heat spreader and heat sink. Moreover, it can be used to avoid debiasing due to voltage drops over the metalization. The device performance has been investigated using DC and AC MEDICI simulations and the "Smoothie" database model for FET devices. A device with a breakdown of more than 80 V, an f/sub Tmax/ of 8 GHz, a maximum current of more than 10/sup -4/ A//spl mu/m at V/sub DS/=26 V and an R/sub ON/ of 4m/spl Omega/cm/sup 2/ is demonstrated.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信