衬底噪声和封装耦合对LC-tank vco相位噪声的影响

Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005. Pub Date : 2005-12-05 DOI:10.1109/ESSCIR.2005.1541569

M. Méndez, D. Mateo, X. Aragonès, J. González

{"title":"衬底噪声和封装耦合对LC-tank vco相位噪声的影响","authors":"M. Méndez, D. Mateo, X. Aragonès, J. González","doi":"10.1109/ESSCIR.2005.1541569","DOIUrl":null,"url":null,"abstract":"The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the oscillator due to the substrate and the package are analyzed, indicating that both noise at low frequencies and at high frequencies around the oscillation fundamental significantly degrade phase noise.","PeriodicalId":239980,"journal":{"name":"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":"{\"title\":\"Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling\",\"authors\":\"M. Méndez, D. Mateo, X. Aragonès, J. González\",\"doi\":\"10.1109/ESSCIR.2005.1541569\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the oscillator due to the substrate and the package are analyzed, indicating that both noise at low frequencies and at high frequencies around the oscillation fundamental significantly degrade phase noise.\",\"PeriodicalId\":239980,\"journal\":{\"name\":\"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-12-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIR.2005.1541569\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIR.2005.1541569","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 22

摘要

目前的工作解决了LC-tank vco由于现实数字源基板噪声的相位噪声退化的研究。分析了由于衬底和封装导致的噪声耦合到振荡器输出的主要机制，表明低频和高频噪声在振荡基基周围都显著降低了相位噪声。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling

The present work addresses the investigation of phase noise degradation of LC-tank VCOs due to realistic digitally originated substrate noise. The dominant mechanisms by which this noise is coupled to the output of the oscillator due to the substrate and the package are analyzed, indicating that both noise at low frequencies and at high frequencies around the oscillation fundamental significantly degrade phase noise.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.

自引率

0.00%

发文量