扫描显微镜的最佳采样和重建策略

EDFA Technical Articles Pub Date : 2022-02-01 DOI:10.31399/asm.edfa.2022-1.p011

N. Browning, D. Nicholls, J. Wells, Alex W Robinson

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摘要

本文讨论了在扫描透射电子显微镜(STEM)中与最小化光束剂量相关的权衡，并解释了如何通过亚采样和涂膜来减少光束暴露，这是一种优化图像质量和分辨率的信号重建技术。虽然该方法是在STEM成像的背景下描述的，但它适用于任何扫描成像系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Optimal Sampling and Reconstruction Strategies for Scanning Microscopes

This article discusses the tradeoffs associated with minimizing beam dose in a scanning transmission electron microscope (STEM) and explains how to reduce beam exposure through subsampling and inpainting, a signal reconstruction technique that optimizes image quality and resolution. Although the method is described in the context of STEM imaging, it applies to any scanned imaging system.

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EDFA Technical Articles

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