T. Koprucki, Anieza Maltsi, T. Niermann, T. Streckenbach, K. Tabelow, J. Polzehl
{"title":"不同形状的In(Ga)As/GaAs量子点模拟TEM图像数据库研究","authors":"T. Koprucki, Anieza Maltsi, T. Niermann, T. Streckenbach, K. Tabelow, J. Polzehl","doi":"10.1109/NUSOD.2019.8807025","DOIUrl":null,"url":null,"abstract":"We present a database of simulated transmission electron microscopy (TEM) images for In(Ga)As quantum dots (QDs) embedded in bulk-like GaAs samples. The database contains series of TEM images for QDs with various shapes, e.g. pyramidal and lens-shaped, depending on the size and indium concentration as well as on the excitation conditions of the electron beam. This database is a key element of a novel concept for model-based geometry reconstruction (MBGR) of semiconductor QDs from TEM imaging and can be used to establish a statistical procedure for the estimation of QD properties and classification of QD types based on machine learning techniques.","PeriodicalId":369769,"journal":{"name":"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"On a Database of Simulated TEM Images for In(Ga)As/GaAs Quantum Dots with Various Shape\",\"authors\":\"T. Koprucki, Anieza Maltsi, T. Niermann, T. Streckenbach, K. Tabelow, J. Polzehl\",\"doi\":\"10.1109/NUSOD.2019.8807025\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a database of simulated transmission electron microscopy (TEM) images for In(Ga)As quantum dots (QDs) embedded in bulk-like GaAs samples. The database contains series of TEM images for QDs with various shapes, e.g. pyramidal and lens-shaped, depending on the size and indium concentration as well as on the excitation conditions of the electron beam. This database is a key element of a novel concept for model-based geometry reconstruction (MBGR) of semiconductor QDs from TEM imaging and can be used to establish a statistical procedure for the estimation of QD properties and classification of QD types based on machine learning techniques.\",\"PeriodicalId\":369769,\"journal\":{\"name\":\"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUSOD.2019.8807025\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD.2019.8807025","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On a Database of Simulated TEM Images for In(Ga)As/GaAs Quantum Dots with Various Shape
We present a database of simulated transmission electron microscopy (TEM) images for In(Ga)As quantum dots (QDs) embedded in bulk-like GaAs samples. The database contains series of TEM images for QDs with various shapes, e.g. pyramidal and lens-shaped, depending on the size and indium concentration as well as on the excitation conditions of the electron beam. This database is a key element of a novel concept for model-based geometry reconstruction (MBGR) of semiconductor QDs from TEM imaging and can be used to establish a statistical procedure for the estimation of QD properties and classification of QD types based on machine learning techniques.