{"title":"非制冷红外探测器的AlGaAsSb-InGaAsSb-GaSb外延异质结构","authors":"O. Sulima, S. Datta, J. A. Cox, M. Mauk, B. Rafol","doi":"10.1109/LECHPD.2002.1146768","DOIUrl":null,"url":null,"abstract":"Lattice matched n-type AlGaAsSb-InGaAsSb-GaSb heterostructures for uncooled infrared detectors, including separate absorption and multiplication avalanche photodiodes (SAM-APD), as well as low-voltage InGaAsSb APDs, were grown using inexpensive liquid phase epitaxy. Formation of the pn-junction was performed through diffusion of Zn from the vapor phase. Responsivity at /spl lambda/=2 /spl mu/m as high as 3.5 A/W was achieved in InGaAsSb APD biased at 8 V with the avalanche multiplication starting at 6 V. Our calculations have shown that the above parameters can result in a NEP value as low as 1/spl times/10/sup -12/ W or D* value as high as 2/spl times/10/sup 10/ cm/spl times/Hz/sup 1/2//W at room temperature for 400 /spl mu/m diameter (200 /spl mu/m diameter photoactive area) APDs.","PeriodicalId":137839,"journal":{"name":"Proceedings. IEEE Lester Eastman Conference on High Performance Devices","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"AlGaAsSb-InGaAsSb-GaSb epitaxial heterostructures for uncooled infrared detectors\",\"authors\":\"O. Sulima, S. Datta, J. A. Cox, M. Mauk, B. Rafol\",\"doi\":\"10.1109/LECHPD.2002.1146768\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Lattice matched n-type AlGaAsSb-InGaAsSb-GaSb heterostructures for uncooled infrared detectors, including separate absorption and multiplication avalanche photodiodes (SAM-APD), as well as low-voltage InGaAsSb APDs, were grown using inexpensive liquid phase epitaxy. Formation of the pn-junction was performed through diffusion of Zn from the vapor phase. Responsivity at /spl lambda/=2 /spl mu/m as high as 3.5 A/W was achieved in InGaAsSb APD biased at 8 V with the avalanche multiplication starting at 6 V. Our calculations have shown that the above parameters can result in a NEP value as low as 1/spl times/10/sup -12/ W or D* value as high as 2/spl times/10/sup 10/ cm/spl times/Hz/sup 1/2//W at room temperature for 400 /spl mu/m diameter (200 /spl mu/m diameter photoactive area) APDs.\",\"PeriodicalId\":137839,\"journal\":{\"name\":\"Proceedings. IEEE Lester Eastman Conference on High Performance Devices\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. IEEE Lester Eastman Conference on High Performance Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LECHPD.2002.1146768\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. IEEE Lester Eastman Conference on High Performance Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LECHPD.2002.1146768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
AlGaAsSb-InGaAsSb-GaSb epitaxial heterostructures for uncooled infrared detectors
Lattice matched n-type AlGaAsSb-InGaAsSb-GaSb heterostructures for uncooled infrared detectors, including separate absorption and multiplication avalanche photodiodes (SAM-APD), as well as low-voltage InGaAsSb APDs, were grown using inexpensive liquid phase epitaxy. Formation of the pn-junction was performed through diffusion of Zn from the vapor phase. Responsivity at /spl lambda/=2 /spl mu/m as high as 3.5 A/W was achieved in InGaAsSb APD biased at 8 V with the avalanche multiplication starting at 6 V. Our calculations have shown that the above parameters can result in a NEP value as low as 1/spl times/10/sup -12/ W or D* value as high as 2/spl times/10/sup 10/ cm/spl times/Hz/sup 1/2//W at room temperature for 400 /spl mu/m diameter (200 /spl mu/m diameter photoactive area) APDs.