RTD光发射约1550 nm,在300 K时IQE高达6%

E. Brown, W.-D. Zhang, P. Fakhimi, T. A. Growden, P. R. Berger
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引用次数: 1

摘要

谐振隧道二极管(rtd)自20世纪90年代初被证明是最快的室温半导体振荡器以来,在过去的10年里又兜了一圈,实验结果高达712 GHz,最大值超过1.0 THz[1]。现在,RTD再次成为1.0太赫兹以上的卓越电子振荡器,并被实现为相干源[2]和自振荡混频器[3],以及其他应用。本文关注的是RTD电致发光效应,在过去30多年的RTD发展中,这一效应的研究很少,而且不是在室温下进行的。本文介绍了一种n型In 0.53 ga 0.47 as /AlAs双势垒RTD在~300K下作为交叉隙光发射器工作的实验和建模。mbe生长堆栈如图1(a)所示。采用标准的平面加工方法定义了一个直径为15 μm的台面器件,其中包括顶部环形欧姆接触和中心5 μm直径的针孔,以耦合出足够的内部发射,从而实现精确的自由空间功率测量[4]。发射光谱的行为如图1(b)所示,由偏置电压(V b)参数化。长波发射边缘在λ = 1684 nm处,接近In 0.53 ga0。在300 K时,U g的带隙能≈0.75 eV。vb = 2.8和3.0 V的光谱峰都出现在λ = 1550 nm (hv = 0.75 eV)附近,因此相对于图1(B)所示的“理想”体InGaAs发射光谱的峰发生了蓝移[5]。这些结果与图1(c)所示的模型一致,其中宽发射峰是由于在发射侧积累的电子与在发射侧以电流密度J interr的带间隧穿产生的空穴之间的辐射复合。蓝移主峰归因于发射侧的量子尺寸效应,它产生了与带边交叉隙率rn1,1相当的辐射复合率rn2,2。图1(b)中λ = 1148 nm附近的波长较短,发射峰较弱,这进一步支持了该模型。我们的量子力学计算将此归因于RTD量子阱中电子基态能级e1, E和空穴能级e1,h之间的辐射复合R R,3。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
RTD Light Emission around 1550 nm with IQE up to 6% at 300 K
Resonant tunneling diodes (RTDs) have come full-circle in the past 10 years after their demonstration in the early 1990s as the fastest room-temperature semiconductor oscillator, displaying experimental results up to 712 GHz and f max values exceeding 1.0 THz [1] . Now the RTD is once again the preeminent electronic oscillator above 1.0 THz and is being implemented as a coherent source [2] and a self-oscillating mixer [3] , amongst other applications. This paper concerns RTD electroluminescence - an effect that has been studied very little in the past 30+ years of RTD development, and not at room temperature. We present experiments and modeling of an n-type In 0 .53Ga 0 .47As/AlAs double-barrier RTD operating as a cross-gap light emitter at ~300K. The MBE-growth stack is shown in Fig. 1(a) . A 15-μm-diam-mesa device was defined by standard planar processing including a top annular ohmic contact with a 5-μm-diam pinhole in the center to couple out enough of the internal emission for accurate free-space power measurements [4] . The emission spectra have the behavior displayed in Fig. 1(b) , parameterized by bias voltage (V B ). The long wavelength emission edge is at λ = 1684 nm - close to the In 0.53 Ga 0 . 47 As bandgap energy of U g ≈ 0.75 eV at 300 K. The spectral peaks for V B = 2.8 and 3.0 V both occur around λ = 1550 nm (hv = 0.75 eV), so blue-shifted relative to the peak of the "ideal", bulk InGaAs emission spectrum shown in Fig. 1(b) [5] . These results are consistent with the model displayed in Fig. 1(c) , whereby the broad emission peak is attributed to the radiative recombination between electrons accumulated on the emitter side, and holes generated on the emitter side by interband tunneling with current density J interr . The blue-shifted main peak is attributed to the quantum-size effect on the emitter side, which creates a radiative recombination rate R N,2 comparable to the band-edge cross-gap rate R N,1 . Further support for this model is provided by the shorter wavelength and weaker emission peak shown in Fig. 1(b) around λ = 1148 nm. Our quantum mechanical calculations attribute this to radiative recombination R R,3 in the RTD quantum well between the electron ground-state level E 1,e , and the hole level E 1,h .
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