基于最小二乘支持向量机的模拟集成电路性能建模

T. Kiely, G. Gielen
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引用次数: 81

摘要

本文描述了基于最小二乘支持向量机(LS-SVM)训练的模拟电路性能建模方法在加速或分层模拟电路合成中的应用。训练是一种回归,其中一种特殊形式的函数适合于模拟电路模拟得出的实验性能数据。该方法与基于支持向量机(即分类)更传统的可行性模型方法进行了对比。实验策略的设计是有效模拟采样方案的基础。然后将我们的函数回归的结果与其他两种基于doe的拟合方案进行比较:简单的线性最小二乘回归和使用多项式模型的回归。LS-SVM拟合在拟合测量数据的精度、中间数据点的预测和减少自由模型调整参数方面优于这些方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Performance modeling of analog integrated circuits using least-squares support vector machines
This paper describes the application of least-squares support vector machine (LS-SVM) training to analog circuit performance modeling as needed for accelerated or hierarchical analog circuit synthesis. The training is a type of regression, where a function of a special form is fit to experimental performance data derived from analog circuit simulations. The method is contrasted with a feasibility model approach based on the more traditional use of SVMs, namely classification. A design of experiments (DOE) strategy is reviewed which forms the basis of an efficient simulation sampling scheme. The results of our functional regression are then compared to two other DOE-based fitting schemes: a simple linear least-squares regression and a regression using posynomial models. The LS-SVM fitting has advantages over these approaches in terms of accuracy of fit to measured data, prediction of intermediate data points and reduction of free model tuning parameters.
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