{"title":"电子封装的一种简化域分层介质积分方程法","authors":"Chang Liu, A. Yılmaz","doi":"10.1109/EPEPS47316.2019.193213","DOIUrl":null,"url":null,"abstract":"A reduced-domain layered-medium integral-equation method that models the finite thickness, finite conductivity, and surface roughness of large metallizations via layered-medium Green’s functions is presented. Using a package-scale benchmark interconnect structure, the method is shown to lower the computational cost and complexity of network parameter extraction when an FFT-accelerated iterative solver is used (as it improves matrix conditioning and reduces number of unknowns) without compromising accuracy.","PeriodicalId":304228,"journal":{"name":"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A Reduced-Domain Layered-Medium Integral-Equation Method for Electronic Packages\",\"authors\":\"Chang Liu, A. Yılmaz\",\"doi\":\"10.1109/EPEPS47316.2019.193213\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A reduced-domain layered-medium integral-equation method that models the finite thickness, finite conductivity, and surface roughness of large metallizations via layered-medium Green’s functions is presented. Using a package-scale benchmark interconnect structure, the method is shown to lower the computational cost and complexity of network parameter extraction when an FFT-accelerated iterative solver is used (as it improves matrix conditioning and reduces number of unknowns) without compromising accuracy.\",\"PeriodicalId\":304228,\"journal\":{\"name\":\"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS47316.2019.193213\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS47316.2019.193213","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Reduced-Domain Layered-Medium Integral-Equation Method for Electronic Packages
A reduced-domain layered-medium integral-equation method that models the finite thickness, finite conductivity, and surface roughness of large metallizations via layered-medium Green’s functions is presented. Using a package-scale benchmark interconnect structure, the method is shown to lower the computational cost and complexity of network parameter extraction when an FFT-accelerated iterative solver is used (as it improves matrix conditioning and reduces number of unknowns) without compromising accuracy.