{"title":"大反向偏置安全操作区域为低损耗高","authors":"Y. Uchino, H. Kobayashi, M. Mori, R. Saito","doi":"10.1109/ISPSD.1999.764044","DOIUrl":null,"url":null,"abstract":"A high conductivity IGBT (HiGT) with a reverse biased safe operating area (RBSOA) as large as that of a conventional IGBT has been presented. The fabricated HiGT has a rated current of 50 A and a blocking capability of 3.3 kV. Optimizing the concentration of impurities in the hole carrier layer enabled the HiGT to turn off a current twice the rated current by applying 2200 V, which is the maximum voltage of the 1500 V line. This large RBSOA was maintained while achieving a short circuit capability and a better trade-off relation between the collect-emitter saturation voltage (V/sub CE(sat)/) and the turn-off loss. The V/sub CE(sat)/ of this optimized HiGT was 1.3 V lower than that of a conventional IGBT. The turn-off loss, short circuit capability, and static and dynamic avalanche voltages were equivalent to those of a conventional IGBT.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Large reverse biased safe operating area for a low loss HiGT\",\"authors\":\"Y. Uchino, H. Kobayashi, M. Mori, R. Saito\",\"doi\":\"10.1109/ISPSD.1999.764044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A high conductivity IGBT (HiGT) with a reverse biased safe operating area (RBSOA) as large as that of a conventional IGBT has been presented. The fabricated HiGT has a rated current of 50 A and a blocking capability of 3.3 kV. Optimizing the concentration of impurities in the hole carrier layer enabled the HiGT to turn off a current twice the rated current by applying 2200 V, which is the maximum voltage of the 1500 V line. This large RBSOA was maintained while achieving a short circuit capability and a better trade-off relation between the collect-emitter saturation voltage (V/sub CE(sat)/) and the turn-off loss. The V/sub CE(sat)/ of this optimized HiGT was 1.3 V lower than that of a conventional IGBT. The turn-off loss, short circuit capability, and static and dynamic avalanche voltages were equivalent to those of a conventional IGBT.\",\"PeriodicalId\":352185,\"journal\":{\"name\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1999.764044\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764044","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Large reverse biased safe operating area for a low loss HiGT
A high conductivity IGBT (HiGT) with a reverse biased safe operating area (RBSOA) as large as that of a conventional IGBT has been presented. The fabricated HiGT has a rated current of 50 A and a blocking capability of 3.3 kV. Optimizing the concentration of impurities in the hole carrier layer enabled the HiGT to turn off a current twice the rated current by applying 2200 V, which is the maximum voltage of the 1500 V line. This large RBSOA was maintained while achieving a short circuit capability and a better trade-off relation between the collect-emitter saturation voltage (V/sub CE(sat)/) and the turn-off loss. The V/sub CE(sat)/ of this optimized HiGT was 1.3 V lower than that of a conventional IGBT. The turn-off loss, short circuit capability, and static and dynamic avalanche voltages were equivalent to those of a conventional IGBT.