T. Rajaprabhu, Ashutosh Kumar Singh, A. Jabir, D. Pradhan
{"title":"CF的MODD:用于快速评估多个输出函数的表示","authors":"T. Rajaprabhu, Ashutosh Kumar Singh, A. Jabir, D. Pradhan","doi":"10.1109/HLDVT.2004.1431237","DOIUrl":null,"url":null,"abstract":"Recently a mathematical framework was presented that bridges the gap between bit level BDD representation and word level representations such as BMD and TED. Here we present an approach that demonstrates that these diagrams admit fast evaluation of circuits for multiple outputs. The representation is based on characteristic function which provides faster evaluation time as well as compact representation. The average path length is used as a metric for evaluation time. The results obtained for benchmark circuits shows lesser number of nodes and faster evaluation time compared to binary representation.","PeriodicalId":240214,"journal":{"name":"Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"MODD for CF: a representation for fast evaluation of multiple-output functions\",\"authors\":\"T. Rajaprabhu, Ashutosh Kumar Singh, A. Jabir, D. Pradhan\",\"doi\":\"10.1109/HLDVT.2004.1431237\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recently a mathematical framework was presented that bridges the gap between bit level BDD representation and word level representations such as BMD and TED. Here we present an approach that demonstrates that these diagrams admit fast evaluation of circuits for multiple outputs. The representation is based on characteristic function which provides faster evaluation time as well as compact representation. The average path length is used as a metric for evaluation time. The results obtained for benchmark circuits shows lesser number of nodes and faster evaluation time compared to binary representation.\",\"PeriodicalId\":240214,\"journal\":{\"name\":\"Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HLDVT.2004.1431237\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLDVT.2004.1431237","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
MODD for CF: a representation for fast evaluation of multiple-output functions
Recently a mathematical framework was presented that bridges the gap between bit level BDD representation and word level representations such as BMD and TED. Here we present an approach that demonstrates that these diagrams admit fast evaluation of circuits for multiple outputs. The representation is based on characteristic function which provides faster evaluation time as well as compact representation. The average path length is used as a metric for evaluation time. The results obtained for benchmark circuits shows lesser number of nodes and faster evaluation time compared to binary representation.