用边界扫描电路评价封装开关噪声

1996 Proceedings 46th Electronic Components and Technology Conference Pub Date : 1996-05-28 DOI:10.1109/ECTC.1996.517466

E. Games, U. Shrivastava, J. Liao

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引用次数: 0

摘要

本文介绍了一种评估微处理器同时开关噪声(SSN)的方法。为了控制I/O缓冲区的切换，采用了在处理器上实现的边界扫描架构。在这个实验中，同时测量了多达130个开关输出缓冲器的芯片外围电源噪声。介绍了该装置的使用方法，并给出了SSN的测量结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Package switching noise evaluation using boundary scan circuitry

This paper describes a method for evaluating simultaneous switching noise (SSN) of microprocessors. To control the switching of I/O buffers, the boundary scan architecture implemented on processors is employed. For this experiment, the on die periphery power supply noise was measured with up to 130 simultaneously switching output buffers. The method of exercising the device is described and the results of SSN measurement are presented.

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1996 Proceedings 46th Electronic Components and Technology Conference

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