{"title":"CMOS电路中的最大电流估计","authors":"H. Kriplani, F. Najm, I. Hajj","doi":"10.1109/DAC.1992.227873","DOIUrl":null,"url":null,"abstract":"The authors propose pattern-independent, linear-time algorithms that provide tight upper bounds on maximum envelope current (MEC) waveforms. The proposed approach represents a trade-off between execution speed and tightness of these bounds. The MEC waveform is a point-wise maximum on all the possible waveforms that the circuit can draw. Experimental results on several benchmark circuits are provided to establish the usefulness of this approach.<<ETX>>","PeriodicalId":162648,"journal":{"name":"[1992] Proceedings 29th ACM/IEEE Design Automation Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"68","resultStr":"{\"title\":\"Maximum current estimation in CMOS circuits\",\"authors\":\"H. Kriplani, F. Najm, I. Hajj\",\"doi\":\"10.1109/DAC.1992.227873\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors propose pattern-independent, linear-time algorithms that provide tight upper bounds on maximum envelope current (MEC) waveforms. The proposed approach represents a trade-off between execution speed and tightness of these bounds. The MEC waveform is a point-wise maximum on all the possible waveforms that the circuit can draw. Experimental results on several benchmark circuits are provided to establish the usefulness of this approach.<<ETX>>\",\"PeriodicalId\":162648,\"journal\":{\"name\":\"[1992] Proceedings 29th ACM/IEEE Design Automation Conference\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"68\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1992] Proceedings 29th ACM/IEEE Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1992.227873\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1992] Proceedings 29th ACM/IEEE Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1992.227873","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors propose pattern-independent, linear-time algorithms that provide tight upper bounds on maximum envelope current (MEC) waveforms. The proposed approach represents a trade-off between execution speed and tightness of these bounds. The MEC waveform is a point-wise maximum on all the possible waveforms that the circuit can draw. Experimental results on several benchmark circuits are provided to establish the usefulness of this approach.<>